| 2025 | Yang, D., Jang, J., & Kim, C. O.,Classifying mixed-defect from single-defect training in imbalanced wafer maps via diffusion and attention. Expert Systems with Applications, Volume 299, Part B, 1 March 2026, 130127 |
| 2025 | Lee, D. R., & Kim, C. O., Long-tailed classification based on dynamic class average loss. Expert Systems with Applications, Volume 288, 1 September 2025, 128292 |
| 2025 | Jung, S., Jang, J., & Kim, C. O., A Lightweight Two-Step Detection Method for Real-Time Small UAV Detection. IEEE Access, Volume 13, pp. 128771-128788, 18 July 2025 |
| 2025 | Joo, J., & Kim, C. O., Global Feature Identification Layer for Mixed-Type Wafer Bin Map Classification. Expert Systems with Applications, Volume 271, 1 May 2025, 126709 |
| 2025 | Jang, J., & Kim, C. O., Teacher-Explorer-Student Learning: A Novel Learning Method for Open Set Recognition. IEEE Transactions on Neural Networks and Learning Systems, Volume 36, No. 1, pp. 767-780, January 2025 |
| 2025 | Kwon, S., Jang, J., & Kim, C. O., Credit scoring using multi-task Siamese neural network for improving prediction performance and stability. Expert Systems with Applications, Volume 259, 1 January 2025, 125327 |
| 2024 | Lee, Y., Kim, Y., Lee, B., & Kim, C. O., Discovery of Fault-Introducing Tool Groups with a Numerical Association Rule Mining Method in Printed Circuit Board Production Line. International Journal of Production Research, Volume 62, No. 9, pp. 3305-3319, 2024 |
| 2024 | Choi, Y. J., Lee, G. T., & Kim, C. O., SAFE: Unsupervised image feature extraction using self-attention based feature extraction network. Expert Systems, Volume 41, Issue 8, 2024 |
| 2024 | Jang, J., & Kim, C. O., Collective decision of one-vs-rest networks for open-set recognition. IEEE Transactions on Neural Networks and Learning Systems, Volume 35, No. 2, pp. 2327-2338, 2024 |
| 2023 | Hwang, H. J., Jang, J., Choi, J., Bae, J. H., Kim, S. H., & Kim, C. O., Stepwise Soft Actor–Critic for UAV Autonomous Flight Control. Drones, Volume 7, No. 9, 549, 2023 |
| 2023 | Choi, J., Kim, H. M., Hwang, H. J., Kim, Y.-D., & Kim, C. O., Modular Reinforcement Learning for Autonomous UAV Flight Control. Drones, Volume 7, No. 7, 418, 2023 |
| 2023 | Joo, J., Yang, K. W., Choi, Y. J., Min, B., & Kim, C. O., Virtual Metrology Modeling for Wafer Edges via Graph Attention Networks. IEEE Transactions on Semiconductor Manufacturing, Volume 36, No. 3, pp. 359-366, 2023 |
| 2023 | Lim, H. G., Jang, J., Ju, B. K., Ko, J. W., & Kim, C. O., A test vector selection method based on machine learning for efficient presilicon verification. Expert Systems with Applications, Volume 224, 120056, 2023 |
| 2022 | An, D. W., Kim, S., Kim, H. K., & Kim, C. O., Commonality analysis for detecting failures caused by inspection tools in semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, Volume 35, No. 4, pp. 596-604, 2022 |
| 2022 | Shin, H. S., Kim, Y., Kim, C. O., & Park, S. H., Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits. Expert Systems with Applications, Volume 202, 117341, 2022 |
| 2022 | Lee, M. Y., Choi, Y. J., Lee, G. T., Choi, J., & Kim, C. O., Attention mechanism-based root cause analysis for semiconductor yield enhancement considering the order of manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, Volume 35, No. 2, pp. 282-290, 2022 |
| 2022 | Jang, J., & Kim, C. O., Siamese Network-Based Health Representation Learning and Robust Reference-Based Remaining Useful Life Prediction. IEEE Transactions on Industrial Informatics, Volume 18, No. 8, pp. 5264-5274, 2022 |
| 2022 | Min, B., & Kim, C. O., State-Dependent Parameter Tuning of the Apparent Tardiness Cost Dispatching Rule Using Deep Reinforcement Learning. IEEE Access, Volume 10, pp. 20187-20198, 2022 |
| 2022 | Heo, T., Kim, Y., & Kim, C. O., A Modified Lasso Model for Yield Analysis Considering the Interaction Effect in a Multistage Manufacturing Line. IEEE Transactions on Semiconductor Manufacturing, Volume 35, No. 1, pp. 32-39, 2022 |
| 2022 | Jang, J., & Kim, C. O., Unstructured borderline self-organizing map: Learning highly imbalanced, high-dimensional datasets for fault detection. Expert Systems with Applications, Volume 188, 116028, 2022 |
| 2021 | Kim, S., Jang, J., & Kim, C. O., A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks. Journal of Intelligent Manufacturing, Volume 32, No. 8, pp. 2267-2280, 2021 |
| 2021 | Kim, Y., Lee, H., & Kim, C. O., A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance. Journal of Intelligent Manufacturing, 2021 |
| 2021 | Lee, G. T., Kim, C. O., & Song, M., Semisupervised sentiment analysis method for online text reviews. Journal of Information Science, Volume 47, No. 3, pp. 387-403, 2021 |
| 2021 | Park, S., Jang, J., & Kim, C. O., Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. Journal of Intelligent Manufacturing, Volume 32, No. 1, pp. 251-263, 2021 |
| 2020 | Lee, G. T., & Kim, C. O., Autonomous Control of Combat Unmanned Aerial Vehicles to Evade Surface-to-Air Missiles Using Deep Reinforcement Learning. IEEE Access, Volume 8, pp. 226724-226736, 2020 |
| 2020 | Jang, J., Seo, M., & Kim, C. O., Support weighted ensemble model for open set recognition of wafer map defects. IEEE Transactions on Semiconductor Manufacturing, Volume 33, No. 4, pp. 635-643, 2020 |
| 2020 | Lee, K. B., & Kim, C. O., Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process. Journal of Intelligent Manufacturing, Volume 31, No. 1, pp. 73-86, 2020 |
| 2019 | Kim, S. J., Yoon, H. G., Lee, K. B., Kim, C. O., & Kim, S. J., Hybrid overlay modeling for field-by-field error correction in the photolithography process. IEEE Transactions on Semiconductor Manufacturing, Volume 33, No. 1, pp. 53-61, 2019 |
| 2019 | Jang, J., Min, B. W., & Kim, C. O., Denoised residual trace analysis for monitoring semiconductor process faults. IEEE Transactions on Semiconductor Manufacturing, Volume 32, No. 3, pp. 293-301, 2019 |
| 2019 | Jang, J., Yoon, H. G., Kim, J. C., & Kim, C. O., Adaptive weapon-to-target assignment model based on the real-time prediction of hit probability. IEEE Access, Volume 7, pp. 72210-72220, 2019 |
| 2019 | Lee, K. B., & Kim, C. O., Marker layout for optimizing the overlay alignment in a photolithography process. IEEE Transactions on Semiconductor Manufacturing, Volume 32, No. 2, pp. 212-219, 2019 |
| 2019 | Cheon, S., Lee, H., Kim, C. O., & Lee, S. H., Convolutional neural network for wafer surface defect classification and the detection of unknown defect class. IEEE Transactions on Semiconductor Manufacturing, Volume 32, No. 2, pp. 163-170, 2019 |
| 2019 | Kwak, J., Lee, K. B., Jang, J., Chang, K. S., & Kim, C. O., Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques. Journal of Intelligent Manufacturing, Volume 30, No. 3, pp. 1047-1055, 2019 |
| 2019 | Lee, H., Lim, J., Lee, K., & Kim, C. O., Agent simulation-based ordinal optimisation for new product design. Journal of the Operational Research Society, Volume 70, No. 3, pp. 502-515, 2019 |
| 2017 | Lee, K. B., Cheon, S., & Kim, C. O., A convolutional neural network for fault classification and diagnosis in semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, Volume 30, No. 2, pp. 135-142, 2017 |
| 2017 | Lee, H., Choi, B. J., Kim, C. O., Kim, J. S., & Kim, J. E., Threat evaluation of enemy air fighters via neural network-based Markov chain modeling. Knowledge-Based Systems, Volume 116, pp. 49-57, 2017 |
| 2016 | Lee, H., Kim, Y., & Kim, C. O., A deep learning model for robust wafer fault monitoring with sensor measurement noise. IEEE Transactions on Semiconductor Manufacturing, Volume 30, No. 1, pp. 23-31, 2016 |
| 2016 | Lee, T., Lee, K. B., & Kim, C. O., Performance of machine learning algorithms for class-imbalanced process fault detection problems. IEEE Transactions on Semiconductor Manufacturing, Volume 29, No. 4, pp. 436-445, 2016 |
| 2016 | Yoon, H. G., Kim, H., Kim, C. O., & Song, M., Opinion polarity detection in Twitter data combining shrinkage regression and topic modeling. Journal of Informetrics, Volume 10, No. 2, pp. 634-644, 2016 |
| 2015 | Lee, H., Kim, C. O., Ko, H. H., & Kim, M. K., Yield prediction through the event sequence analysis of the die attach process. IEEE Transactions on Semiconductor Manufacturing, Volume 28, No. 4, pp. 563-570, 2015 |
| 2015 | Kwak, J., Lee, T., & Kim, C. O., An incremental clustering-based fault detection algorithm for class-imbalanced process data. IEEE Transactions on Semiconductor Manufacturing, Volume 28, No. 3, pp. 318-328, 2015 |
| 2015 | Kim, J., Kim, C. O., & Kwak, C., Analysis of timeout mechanism in a testing-repair model. International Journal of Production Research, Volume 53, No. 7, pp. 1996-2010, 2015 |
| 2015 | Lee, H., Kwak, J., Song, M., & Kim, C. O., Coherence analysis of research and education using topic modeling. Scientometrics, Volume 102, No. 2, pp. 1119-1137, 2015 |
| 2014 | Lee, T., & Kim, C. O., Statistical comparison of fault detection models for semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing, Volume 28, No. 1, pp. 80-91, 2014 |
| 2014 | Sim, H., Choi, D., & Kim, C. O., A data mining approach to the causal analysis of product faults in multi-stage PCB manufacturing. International Journal of Precision Engineering and Manufacturing, Volume 15, No. 8, pp. 1563-1573, 2014 |
| 2014 | Lee, K., Lee, H., & Kim, C. O., Pricing and timing strategies for new product using agent-based simulation of behavioural consumers. Journal of Artificial Societies and Social Simulation, Volume 17, No. 2, 1, 2014 |
| 2014 | Kim, S. T., Hong, S. R., & Kim, C. O., Product attribute design using an agent-based simulation of an artificial market. International Journal of Simulation Modelling, Volume 13, No. 3, pp. 288-299, 2014 |
| 2013 | Lee, K., Kim, S., Kim, C. O., & Park, T., An agent-based competitive product diffusion model for the estimation and sensitivity analysis of social network structure and purchase time distribution. Journal of Artificial Societies and Social Simulation, Volume 16, No. 1, 3, 2013 |
| 2013 | Ko, J. M., Hong, S. R., Choi, J. Y., & Kim, C. O., Wafer-to-wafer process fault detection using data stream mining techniques. International Journal of Precision Engineering and Manufacturing, Volume 14, No. 1, pp. 103-113, 2013 |
| 2012 | Ko, J. M., & Kim, C. O., A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool. International Journal of Production Research, Volume 50, No. 23, pp. 6639-6654, 2012 |
| 2012 | Park, T., Lee, T., & Kim, C. O., Due-date scheduling on parallel machines with job splitting and sequence-dependent major/minor setup times. The International Journal of Advanced Manufacturing Technology, Volume 59, No. 1, pp. 325-333, 2012 |
| 2011 | Kwak, C., Park, E., & Kim, C. O., Situation dependent decision selector for production control in testing and rework cell. International Journal of Production Research, Volume 49, No. 15, pp. 4505-4516, 2011 |
| 2011 | Kim, S., Lee, K., Cho, J. K., & Kim, C. O., Agent-based diffusion model for an automobile market with fuzzy TOPSIS-based product adoption process. Expert Systems with Applications, Volume 38, No. 6, pp. 7270-7276, 2011 |
| 2011 | Ko, J. M., Kwak, C., Cho, Y., & Kim, C. O., Adaptive product tracking in RFID-enabled large-scale supply chain. Expert Systems with Applications, Volume 38, No. 3, pp. 1583-1590, 2011 |
| 2010 | Ko, J. M., Kim, C. O., Lee, S. J., & Hong, J. P., Structural feature-based fault-detection approach for the recipes of similar products. IEEE Transactions on Semiconductor Manufacturing, Volume 23, No. 2, pp. 273-283, 2010 |
| 2010 | Hong, S. R., Kim, S. T., & Kim, C. O., Neural network controller with on-line inventory feedback data in RFID-enabled supply chain. International Journal of Production Research, Volume 48, No. 9, pp. 2613-2632, 2010 |
| 2010 | Shin, K. H., Kwon, I. H., Lee, J. H., & Kim, C. O., Performance trajectory-based optimised supply chain dynamics. International Journal of Computer Integrated Manufacturing, Volume 23, No. 1, pp. 87-100, 2010 |
| 2010 | Kim, C. O., Kwon, I. H., & Kwak, C., Multi-agent based distributed inventory control model. Expert Systems with Applications, Volume 37, No. 7, pp. 5186-5191, 2010 |
| 2009 | Kwak, C., Choi, J. S., Kim, C. O., & Kwon, I. H., Situation reactive approach to Vendor Managed Inventory problem. Expert Systems with Applications, Volume 36, No. 5, pp. 9039-9045, 2009 |
| 2009 | Woo, S. H., Choi, J. Y., Kwak, C., & Kim, C. O., An active product state tracking architecture in logistics sensor networks. Computers in Industry, Volume 60, No. 3, pp. 149-160, 2009 |
| 2009 | Yoo, J. S., Hong, S. R., & Kim, C. O., Service level management of nonstationary supply chain using direct neural network controller. Expert Systems with Applications, Volume 36, No. 2, pp. 3574-3586, 2009 |
| 2009 | Kwak, C., & Kim, C. O., A multicriteria approach to timeout collaboration protocol. International Journal of Production Research, Volume 47, No. 22, pp. 6417-6432, 2009 |
| 2008 | Ko, J. M., Kim, C. O., & Kwon, I. H., Quality-of-service oriented web service composition algorithm and planning architecture. Journal of Systems and Software, Volume 81, No. 11, pp. 2079-2090, 2008 |
| 2008 | Kim, M. C., Kim, C. O., Hong, S. R., & Kwon, I. H., Forward–backward analysis of RFID-enabled supply chain using fuzzy cognitive map and genetic algorithm. Expert Systems with Applications, Volume 35, No. 3, pp. 1166-1176, 2008 |
| 2008 | Kwon, I. H., Kim, C. O., Jun, J., & Lee, J. H., Case-based myopic reinforcement learning for satisfying target service level in supply chain. Expert Systems with Applications, Volume 35, No. 1-2, pp. 389-397, 2008 |
| 2008 | Kwon, I. H., Kim, C. O., Kim, K. P., & Kwak, C., Recommendation of e-commerce sites by matching category-based buyer query and product e-catalogs. Computers in Industry, Volume 59, No. 4, pp. 380-394, 2008 |
| 2008 | Lee, J. H., & Kim, C. O., Multi-agent systems applications in manufacturing systems and supply chain management: a review paper. International Journal of Production Research, Volume 46, No. 1, pp. 233-265, 2008 |
| 2008 | Kim, C. O., Kwon, I. H., & Baek, J. G., Asynchronous action-reward learning for nonstationary serial supply chain inventory control. Applied Intelligence, Volume 28, No. 1, pp. 1-16, 2008 |
| 2007 | Baek, J. G., & Kim, C. O., Learning single-issue negotiation strategies using hierarchical clustering method. Expert Systems with Applications, Volume 32, No. 2, pp. 606-615, 2007 |
| 2006 | Baek, J. G., Kim, C. O., & Kwon, I. H., An adaptive inventory control model for a supply chain with nonstationary customer demands. Pacific Rim International Conference on Artificial Intelligence, pp. 895-900, 2006 |
| 2006 | Kim, C. O., Baek, J. G., & Jun, J., Meta-model driven collaborative object analysis process for production planning and scheduling domain. International Conference on Computational Science and Its Applications, pp. 839-850, 2006 |
| 2005 | Kim, C. O., Cho, Y. H., Yoon, J. U., Kwak, C. J., & Seo, Y. H., Ontology based negotiation case search system for the resolution of exceptions in collaborative production planning. OTM Confederated International Conferences "On the Move to Meaningful Internet Systems", pp. 24-25, 2005 |
| 2005 | Kim, C. O., Jun, J., Baek, J. K., Smith, R. L., & Kim, Y. D., Adaptive inventory control models for supply chain management. The International Journal of Advanced Manufacturing Technology, Volume 26, No. 9, pp. 1184-1192, 2005 |
| 2005 | Kim, C. O., Baek, J. G., & Jun, J., A machine cell formation algorithm for simultaneously minimising machine workload imbalances and inter-cell part movements. The International Journal of Advanced Manufacturing Technology, Volume 26, No. 3, pp. 268-275, 2005 |
| 2005 | Kim, C. O., Park, Y., & Baek, J. G., Optimal signal control using adaptive dynamic programming. International Conference on Computational Science and Its Applications, pp. 148-160, 2005 |
| 2005 | Kwak, C., & Kim, C. O., Dispatching decisions within preemption procedure. International Journal of Industrial Engineering: Theory Applications and Practice, Volume 12, No. 1, pp. 23-27, 2005 |
| 2004 | Kim, C. O., Baek, J. G., & Baek, J. K., A two-phase heuristic algorithm for cell formation problems considering alternative part routes and machine sequences. International Journal of Production Research, Volume 42, No. 18, pp. 3911-3927, 2004 |
| 2003 | Kim, C. O., & Shin, H. J., Scheduling jobs on parallel machines: a restricted tabu search approach. The International Journal of Advanced Manufacturing Technology, Volume 22, No. 3, pp. 278-287, 2003 |
| 2003 | Kim, S. S., Shin, H. J., Eom, D. H., & Kim, C. O., A due date density-based categorising heuristic for parallel machines scheduling. The International Journal of Advanced Manufacturing Technology, Volume 22, No. 9, pp. 753-760, 2003 |
| 2002 | Kim, C. O., Jun, J., Kim, S. S., & Baek, J. K., Contract-collaboration network method for modeling manufacturing resource control workflows. Journal of Intelligent Manufacturing, Volume 13, No. 6, pp. 463-475, 2002 |
| 2002 | Shin, H. J., Kim, C. O., & Kim, S. S., A tabu search algorithm for single machine scheduling with release times, due dates, and sequence-dependent set-up times. The International Journal of Advanced Manufacturing Technology, Volume 19, No. 11, pp. 859-866, 2002 |
| 2002 | Baek, J. G., Kim, C. O., & Kim, S. S., Online learning of the cause-and-effect knowledge of a manufacturing process. International Journal of Production Research, Volume 40, No. 14, pp. 3275-3290, 2002 |
| 2001 | Kim, C. O., & Nof, S. Y., Design of collaboration framework for distributed CIM data activities. IIE Transactions, Volume 33, No. 7, pp. 535-546, 2001 |
| 2000 | Kim, C. O., & Nof, S. Y., Investigation of PVM for the emulation and simulation of a distributed CIM workflow system. International Journal of Computer Integrated Manufacturing, Volume 13, No. 5, pp. 401-409, 2000 |
| 2000 | Kwon, I. M., Kim, C. O., Jun, J., & Kim, S. S., Building generic data interface components through a data object generalization pattern. JOOP-Journal of Object-Oriented Programming, Volume 13, No. 6, pp. 6-10, 2000 |
| 1998 | Kim, C. O., Min, H. S., & Yih, Y., Integration of inductive learning and neural networks for multi-objective FMS scheduling. International Journal of Production Research, Volume 36, No. 9, pp. 2497-2509, 1998 |
| 1998 | Min, H. S., Yih, Y., & Kim, C. O., A competitive neural network approach to multi-objective FMS scheduling. International Journal of Production Research, Volume 36, No. 7, pp. 1749-1765, 1998 |
| 1998 | Kim, C. O., & Nof, S. Y., A collaboration scheme for distributed CIM data activities. International Journal of Industrial Engineering: Theory Applications and Practice, Volume 5, No. 1, pp. 68-77, 1998 |
| 1997 | Kim, C. O., & Nof, S. Y., Coordination and integration models for distributed and heterogeneous CIM information. Knowledge-Based Systems: Advanced Concepts, Techniques and Applications, pp. 587-601, 1997 |
